Information card for entry 4104021

Structure parameters

• Common name: Bis(2-methylpropyldimethylsilyl)telluride
• Chemical name: Bis(2-methylpropyldimethylsilyl)telluride
• Formula: C12 H30 Si2 Te
• Calculated formula: C12 H30 Si2 Te
• SMILES: C[Si](C)(C(C)(C)C)[Te][Si](C)(C)C(C)(C)C
• Title of publication: Atomic Layer Deposition of Metal Tellurides and Selenides Using Alkylsilyl Compounds of Tellurium and Selenium
• Authors of publication: Viljami Pore; Timo Hatanpää; Mikko Ritala; Markku Leskelä
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2009
• Journal volume: 131
• Pages of publication: 3478 - 3480
• a: 23.936 ± 0.005 Å
• b: 6.8126 ± 0.0014 Å
• c: 12.455 ± 0.003 Å
• α: 90°
• β: 118.2 ± 0.03°
• γ: 90°
• Cell volume: 1789.9 ± 0.8 ų
• Cell temperature: 123 ± 2 K
• Ambient diffraction temperature: 123 ± 2 K
• Number of distinct elements: 4
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0415
• Residual factor for significantly intense reflections: 0.0356
• Weighted residual factors for significantly intense reflections: 0.1079
• Weighted residual factors for all reflections included in the refinement: 0.1097
• Goodness-of-fit parameter for all reflections included in the refinement: 1.427
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No