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Information card for entry 4104600
Preview
Coordinates | 4104600.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Formula | C30 H50 B2 N2 O2 Si4 |
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Calculated formula | C30 H50 B2 N2 O2 Si4 |
SMILES | [Si](N(B1C(=C1C1B(C=1c1ccc(cc1)OC)N([Si](C)(C)C)[Si](C)(C)C)c1ccc(cc1)OC)[Si](C)(C)C)(C)(C)C |
Title of publication | Borylene-Based Direct Functionalization of Organic Substrates: Synthesis, Characterization, and Photophysical Properties of Novel π-Conjugated Borirenes |
Authors of publication | Holger Braunschweig; Thomas Herbst; Daniela Rais; Sundargopal Ghosh; Thomas Kupfer; Krzysztof Radacki; Andrew G. Crawford; Richard M. Ward; Todd B. Marder; Israel Fernández; Gernot Frenking |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 8989 - 8999 |
a | 9.5049 ± 0.0011 Å |
b | 13.4023 ± 0.0014 Å |
c | 15.0311 ± 0.0018 Å |
α | 81.229 ± 0.005° |
β | 72.047 ± 0.005° |
γ | 79.572 ± 0.005° |
Cell volume | 1781.9 ± 0.4 Å3 |
Cell temperature | 98 ± 2 K |
Ambient diffraction temperature | 98 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0529 |
Residual factor for significantly intense reflections | 0.0407 |
Weighted residual factors for significantly intense reflections | 0.1065 |
Weighted residual factors for all reflections included in the refinement | 0.1146 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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