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Information card for entry 4104670
Preview
| Coordinates | 4104670.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H23 B10 Cl Pd S2 |
|---|---|
| Calculated formula | C16 H23 B10 Cl Pd S2 |
| SMILES | [Pd]12(Cl)[S](C[C]3456[B]7892[C]2%10%11(C[S]1c1ccccc1)[BH]137[BH]374[BH]4%125[BH]568[BH]68%12[BH]%1274[BH]213[BH]%118%12[BH]9%1056)c1ccccc1 |
| Title of publication | Carborane-Based Pincers: Synthesis and Structure of SeBSe and SBS Pd(II) Complexes |
| Authors of publication | Alexander M. Spokoyny; Matthew G. Reuter; Charlotte L. Stern; Mark A. Ratner; Tamar Seideman; Chad A. Mirkin |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2009 |
| Journal volume | 131 |
| Pages of publication | 9482 - 9483 |
| a | 10.4063 ± 0.0004 Å |
| b | 15.4367 ± 0.0005 Å |
| c | 27.923 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4485.5 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0578 |
| Residual factor for significantly intense reflections | 0.0495 |
| Weighted residual factors for significantly intense reflections | 0.1073 |
| Weighted residual factors for all reflections included in the refinement | 0.1166 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.239 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4104670.html
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