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Information card for entry 4104788
Preview
Coordinates | 4104788.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H76 N8 Si6 U2 |
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Calculated formula | C30 H76 N8 Si6 U2 |
SMILES | [U]12345N6[Si]([CH2]1[U]178(C[Si](N2CC[N]4(CC6)CCN3[Si](C)(C)C)(C)C)N([Si](C)(C)C)CC[N]8(CC[N]51[Si](C)(C)C)CCN7[Si](C)(C)C)(C)C |
Title of publication | A Crystallizable Dinuclear Tuck-In-Tuck-Over Tuck-Over Dialkyl Tren Uranium Complex and Double Dearylation of BPh4- To Give the BPh2-Functionalized Metallocycle [U{N(CH2CH2NSiMe3)2(CH2CH2NSiMe2CHBPh2)}(THF)] |
Authors of publication | Benedict M. Gardner; Jonathan McMaster; William Lewis; Alexander J. Blake; Stephen T. Liddle |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 10388 - 10389 |
a | 10.9142 ± 0.0015 Å |
b | 16.979 ± 0.002 Å |
c | 25.765 ± 0.004 Å |
α | 90° |
β | 100.067 ± 0.003° |
γ | 90° |
Cell volume | 4701.1 ± 1.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0481 |
Residual factor for significantly intense reflections | 0.0282 |
Weighted residual factors for significantly intense reflections | 0.0563 |
Weighted residual factors for all reflections included in the refinement | 0.0616 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4104788.html
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