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Information card for entry 4105000
Preview
Coordinates | 4105000.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C6 H12 Cu D14 N2 O14 Se2 |
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Calculated formula | C6 H12 Cu D14 N2 O14 Se2 |
SMILES | [N+]12([2H])CC[N+]([2H])(CC1)CC2.[Cu]([O]([2H])[2H])([O]([2H])[2H])([O]([2H])[2H])([O]([2H])[2H])([O]([2H])[2H])[O]([2H])[2H].[Se](=O)(=O)([O-])[O-].[Se](=O)(=O)([O-])[O-] |
Title of publication | New Ferroelectrics Based on Divalent Metal Ion Alum |
Authors of publication | Wen Zhang; Li-Zhuang Chen; Ren-Gen Xiong; Takayoshi Nakamura; Songping D. Huang |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 12544 - 12545 |
a | 7.1403 ± 0.0005 Å |
b | 12.6022 ± 0.0009 Å |
c | 9.9441 ± 0.0006 Å |
α | 90° |
β | 91.936 ± 0.002° |
γ | 90° |
Cell volume | 894.29 ± 0.1 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 7 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0276 |
Residual factor for significantly intense reflections | 0.0266 |
Weighted residual factors for significantly intense reflections | 0.0697 |
Weighted residual factors for all reflections included in the refinement | 0.0703 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4105000.html
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