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Information card for entry 4105066
Preview
Coordinates | 4105066.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H39 Nd Si3 |
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Calculated formula | C24 H39 Nd Si3 |
SMILES | [Nd]123456789%10%11%12([cH]%13[cH]4[cH]3[cH]2[c]1%13[Si](C)(C)C)([c]1([cH]8[cH]7[cH]6[cH]51)[Si](C)(C)C)[cH]1[cH]9[cH]%10[cH]%11[c]%121[Si](C)(C)C |
Title of publication | A Comparison of 4f vs 5f Metal-Metal Bonds in (CpSiMe3)3M-ECp* (M = Nd, U; E = Al, Ga; Cp* = C5Me5): Synthesis, Thermodynamics, Magnetism, and Electronic Structure |
Authors of publication | Stefan G. Minasian; Jamin L. Krinsky; Jeffrey D. Rinehart; Roy Copping; Tolek Tyliszczak; Markus Janousch; David K. Shuh; John Arnold |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 13767 - 13783 |
a | 8.3245 ± 0.0005 Å |
b | 22.2396 ± 0.0012 Å |
c | 28.9822 ± 0.0016 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5365.6 ± 0.5 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 4 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0573 |
Residual factor for significantly intense reflections | 0.0349 |
Weighted residual factors for significantly intense reflections | 0.0691 |
Weighted residual factors for all reflections included in the refinement | 0.0765 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.