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Information card for entry 4105205
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Coordinates | 4105205.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Na7[(V=O)7Na7(H2O)7(b-CD)2].65H2O (1) |
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Formula | C84 H256 Na14 O149 V7 |
Calculated formula | C84 H112 Na7 O84 V7 |
SMILES | [V]123(=O)[O]4[Na]56([OH2])[O]1[C@H]1[C@H]7O[C@H]8[C@@H]9[O]5[V]5%10(=O)[O]6[C@H]6[C@H]%11O[C@H]%12[C@H]4[C@H]4[O]2[Na]2%13([OH2])[O]3[C@H]1[C@H](O[C@@H]1[C@@H]3[O]%13[V]%13%14(=O)[O]2[C@@H]2[C@H]%15[O]%13[Na]%13%16([OH2])[O]%14[C@H]3[C@H](O[C@@H]3[C@@H]%14[O]%16[V]%16%17(=O)[O]%13[C@@H]%13[C@H]%18[O]%16[Na]%16%19([OH2])[O]%17[C@H]%14[C@H](O[C@@H]%14[C@@H]%17[O]%16[V]%16%20(=O)[O]%21[C@H]%17[C@@H]([C@H](O%14)CO)O[C@@H]%14[C@@H]%17[O]%22[V]%23%24(=O)[O]%25[Na]%26%27([OH2])[O]%28[V]%29%30(=O)[O]%31[Na]%32([OH2])([O]5[C@H]9[C@H](O[C@@H]8CO)O[C@H]5[C@H]%31[C@@H]%28[C@H](O[C@@H]5CO)O[C@@H]([C@@H]%17%25)[C@H](O%14)CO)[O]%10[C@H]6[C@H](O[C@@H]5[C@H]([O]%29%32)[C@@H]([O]%26%30)[C@H](O[C@@H]6[C@H]([O]%23%27)[C@H]8[O]%24[Na]%21%22([OH2])[O]%16[C@H]9[C@H](O[C@@H]([C@@H](O[C@H]%18O[C@@H]([C@H]%13O[C@H]%15O[C@@H]([C@H]2O[C@H]4O[C@@H]%12CO)CO)CO)[C@@H]9[O]%19%20)CO)O[C@@H]8[C@H](O6)CO)[C@H](O5)CO)[C@H](O%11)CO)[C@H](O3)CO)[C@H](O1)CO)[C@H](O7)CO |
Title of publication | Templating Odd Numbered Magnetic Rings: Oxovanadium Heptagons Sandwiched by β-Cyclodextrins |
Authors of publication | Norihisa Hoshino; Motohiro Nakano; Hiroyuki Nojiri; Wolfgang Wernsdorfer; Hiroki Oshio |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2009 |
Journal volume | 131 |
Pages of publication | 15100 - 15101 |
a | 34.444 ± 0.003 Å |
b | 34.444 ± 0.003 Å |
c | 46.286 ± 0.006 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 47556 ± 9 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 155 |
Hermann-Mauguin space group symbol | R 3 2 :H |
Hall space group symbol | R 3 2" |
Residual factor for all reflections | 0.104 |
Residual factor for significantly intense reflections | 0.0709 |
Weighted residual factors for significantly intense reflections | 0.1761 |
Weighted residual factors for all reflections included in the refinement | 0.1912 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.924 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4105205.html
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Users of the data should acknowledge the original authors of the
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