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Information card for entry 4105665
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Coordinates | 4105665.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (THF)V(tpaMes) |
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Formula | C46 H53 N4 O V |
Calculated formula | C46 H53 N4 O V |
SMILES | [V]123([O]4CCCC4)n4c(C[N]1(Cc1n3c(c3c(C)cc(cc3C)C)cc1)Cc1n2c(c2c(cc(C)cc2C)C)cc1)ccc4c1c(cc(cc1C)C)C |
Title of publication | A Structurally Characterized Nitrous Oxide Complex of Vanadium |
Authors of publication | Nicholas A. Piro; Michael F. Lichterman; W. Hill Harman; Christopher J. Chang |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2011 |
Journal volume | 133 |
Pages of publication | 2108 - 2111 |
a | 10.91 ± 0.007 Å |
b | 11.252 ± 0.007 Å |
c | 16.024 ± 0.01 Å |
α | 90° |
β | 93.368 ± 0.01° |
γ | 90° |
Cell volume | 1964 ± 2 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0518 |
Residual factor for significantly intense reflections | 0.0378 |
Weighted residual factors for significantly intense reflections | 0.0789 |
Weighted residual factors for all reflections included in the refinement | 0.0851 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4105665.html
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structural data.