Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4105707
Preview
Coordinates | 4105707.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H54 Cl5 F6 Ni P3 S2 |
---|---|
Calculated formula | C54 H54 Cl5 F6 Ni P3 S2 |
SMILES | [Ni]12(Cl)([S](CC[P]1(c1ccccc1)c1ccccc1)CCc1ccc3ccccc3c1)[S](CC[P]2(c1ccccc1)c1ccccc1)CCc1ccc2ccccc2c1.ClCCl.ClCCl.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Plasticity of the Nickel(II) Coordination Environment in Complexes with Hemilabile Phosphino Thioether Ligands |
Authors of publication | Charles W. Machan; Alexander M. Spokoyny; Matthew R. Jones; Amy A. Sarjeant; Charlotte L. Stern; Chad A. Mirkin |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2011 |
Journal volume | 133 |
Pages of publication | 3023 - 3033 |
a | 11.5619 ± 0.001 Å |
b | 19.1526 ± 0.0015 Å |
c | 24.083 ± 0.002 Å |
α | 90° |
β | 93.397 ± 0.007° |
γ | 90° |
Cell volume | 5323.6 ± 0.8 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1907 |
Residual factor for significantly intense reflections | 0.0879 |
Weighted residual factors for significantly intense reflections | 0.2146 |
Weighted residual factors for all reflections included in the refinement | 0.2447 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.919 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4105707.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.