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Information card for entry 4105849
Preview
Coordinates | 4105849.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H42 Cl6 Cu Ga P2 Si2 |
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Calculated formula | C41 H42 Cl6 Cu Ga P2 Si2 |
SMILES | [Cu]1[P](c2c([Si]([Si](C)(C)c3c([P]1(c1ccccc1)c1ccccc1)cccc3)(C)C)cccc2)(c1ccccc1)c1ccccc1.[Ga](Cl)([Cl-])(Cl)Cl.C(Cl)Cl |
Title of publication | A Crystalline σ Complex of Copper |
Authors of publication | Pauline Gualco; Abderrahmane Amgoune; Karinne Miqueu; Sonia Ladeira; Didier Bourissou |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2011 |
Journal volume | 133 |
Pages of publication | 4257 - 4259 |
a | 11.3864 ± 0.0003 Å |
b | 13.1062 ± 0.0003 Å |
c | 16.1426 ± 0.0004 Å |
α | 74.488 ± 0.002° |
β | 82.906 ± 0.002° |
γ | 75.135 ± 0.002° |
Cell volume | 2239.67 ± 0.1 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1098 |
Residual factor for significantly intense reflections | 0.0498 |
Weighted residual factors for significantly intense reflections | 0.0977 |
Weighted residual factors for all reflections included in the refinement | 0.1177 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.981 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4105849.html
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