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Information card for entry 4106391
Preview
Coordinates | 4106391.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H62 Hf2 N2 O1.5 Si |
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Calculated formula | C41 H62 Hf2 N2 O1.5 Si |
SMILES | [c]12([cH]3[c]([c]4([cH]51)C)(C)[Hf]167892345([c]2([cH]6[c]7([c]8([cH]92)C)C)C)N([Hf]23456789%10([N]1=CO2)([cH]1[c]3([cH]6[c]4([c]51C)C)C)[cH]1[c]9([c]%10([cH]8[c]71C)C)C)[SiH2]C1CCCCC1)C.C1COCC1 |
Title of publication | Dinitrogen Silylation and Cleavage with a Hafnocene Complex |
Authors of publication | Scott P. Semproni; Emil Lobkovsky; Paul J. Chirik |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2011 |
Journal volume | 133 |
Pages of publication | 10406 - 10409 |
a | 41.29 ± 0.006 Å |
b | 9.5098 ± 0.0013 Å |
c | 19.378 ± 0.003 Å |
α | 90° |
β | 92.26 ± 0.001° |
γ | 90° |
Cell volume | 7603 ± 1.9 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0272 |
Residual factor for significantly intense reflections | 0.0175 |
Weighted residual factors for significantly intense reflections | 0.0357 |
Weighted residual factors for all reflections included in the refinement | 0.0386 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4106391.html
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Users of the data should acknowledge the original authors of the
structural data.