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Information card for entry 4107355
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Coordinates | 4107355.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Eilaf002 |
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Chemical name | Eilaf002 |
Formula | C50 H32 N2 |
Calculated formula | C50 H32 N2 |
SMILES | c12ccccc1c(c1n2c2cc3c(cc4c(c5c(cccc5)n4c3cc2c(c1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | High Mobility Single-Crystal Field-Effect Transistors from Bisindoloquinoline Semiconductors |
Authors of publication | Eilaf Ahmed; Alejandro L. Briseno; Younan Xia; Samson A. Jenekhe |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2008 |
Journal volume | 130 |
Pages of publication | 1118 - 1119 |
a | 18.8707 ± 0.0011 Å |
b | 13.9159 ± 0.0008 Å |
c | 12.4345 ± 0.0007 Å |
α | 90° |
β | 95.581 ± 0.003° |
γ | 90° |
Cell volume | 3249.9 ± 0.3 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 3 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1826 |
Residual factor for significantly intense reflections | 0.0579 |
Weighted residual factors for significantly intense reflections | 0.1025 |
Weighted residual factors for all reflections included in the refinement | 0.1311 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.963 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4107355.html
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