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Information card for entry 4107497
Preview
Coordinates | 4107497.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Si3Se-bicyclo[1.1.0]butane |
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Formula | C36 H84 Se Si7 |
Calculated formula | C36 H84 Se Si7 |
SMILES | [Se]1[Si@@]2([Si@]1([Si]2([Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C)[Si](C)(C(C)(C)C)C(C)(C)C |
Title of publication | Isomeric Metamorphosis: Si3E (E = S, Se, and Te) Bicyclo[1.1.0]butane and Cyclobutene |
Authors of publication | Vladimir Ya. Lee; Shogo Miyazaki; Hiroyuki Yasuda; Akira Sekiguchi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2008 |
Journal volume | 130 |
Pages of publication | 2758 - 2759 |
a | 12.671 ± 0.0004 Å |
b | 17.396 ± 0.0003 Å |
c | 21.867 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4820 ± 0.2 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.063 |
Residual factor for significantly intense reflections | 0.0533 |
Weighted residual factors for significantly intense reflections | 0.1436 |
Weighted residual factors for all reflections included in the refinement | 0.15 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4107497.html
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