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Information card for entry 4107542
Preview
| Coordinates | 4107542.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21.33 H10 Cl4.67 Re2 S16 Se2 |
|---|---|
| Calculated formula | C21.3333 H10 Cl4.66667 Re2 S16 Se2 |
| Title of publication | Modulating the Framework Negative Charge Density in the System [BDT-TTP.+]/[Re6S5Cl91-]/[Re6(S/Se)6Cl82-]/[Re6S7Cl73-]: Templating by Isosteric Cluster Anions of Identical Symmetry and Shape, Variations of Incommensurate Band Filling, and Electronic Structure in 2D Metals |
| Authors of publication | Sandrine Perruchas; Kamal Boubekeur; Enric Canadell; Yohji Misaki; Pascale Auban-Senzier; Claude Pasquier; Patrick Batail |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2008 |
| Journal volume | 130 |
| Pages of publication | 3335 - 3348 |
| a | 11.3494 ± 0.0009 Å |
| b | 12.6428 ± 0.0009 Å |
| c | 22.2207 ± 0.0018 Å |
| α | 94.097 ± 0.009° |
| β | 100.051 ± 0.01° |
| γ | 114.099 ± 0.008° |
| Cell volume | 2829.5 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0875 |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for significantly intense reflections | 0.0729 |
| Weighted residual factors for all reflections included in the refinement | 0.0804 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.777 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4107542.html
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