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Information card for entry 4108231
Preview
| Coordinates | 4108231.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H50 B2 N2 P2 Pt V |
|---|---|
| Calculated formula | C28 H50 B2 N2 P2 Pt V |
| SMILES | [V]123456789%10%11[c]%12([cH]1[cH]2[cH]3[cH]4[cH]5%12)B([Pt](B([c]16[cH]7[cH]8[cH]9[cH]%10[cH]%111)N(C)C)([P](CC)(CC)CC)[P](CC)(CC)CC)N(C)C |
| Title of publication | Synthesis, Reactivity, and Electronic Structure of [n]Vanadoarenophanes: An Experimental and Theoretical Study |
| Authors of publication | Holger Braunschweig; Martin Kaupp; Christopher J. Adams; Thomas Kupfer; Krzysztof Radacki; Sandra Schinzel |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2008 |
| Journal volume | 130 |
| Pages of publication | 11376 - 11393 |
| a | 11.5345 ± 0.0007 Å |
| b | 15.7328 ± 0.001 Å |
| c | 17.2495 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3130.3 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0311 |
| Residual factor for significantly intense reflections | 0.0265 |
| Weighted residual factors for significantly intense reflections | 0.0593 |
| Weighted residual factors for all reflections included in the refinement | 0.0619 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4108231.html
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Users of the data should acknowledge the original authors of the
structural data.