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Information card for entry 4108572
Preview
Coordinates | 4108572.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C13 H6 Cu2 Fe3 N2 O9 Te |
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Calculated formula | C13 H6 Cu2 Fe3 N2 O9 Te |
SMILES | [Te]12[Fe]345([Cu]6789([Cu]%10%11([Fe]136([Fe]247%10(C9=O)(C%11=O)C#[O])(C#[O])(C#[O])C8=O)[N]#CC)([N]#CC)C5=O)(C#[O])C#[O] |
Title of publication | Semiconducting Tellurium-Iron-Copper Carbonyl Polymers |
Authors of publication | Minghuey Shieh; Chia-Hua Ho; Wen-Shyan Sheu; Bo-Gaun Chen; Yen-Yi Chu; Chia-Yeh Miu; Hsiang-Lin Liu; Chih-Chiang Shen |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2008 |
Journal volume | 130 |
Pages of publication | 14114 - 14116 |
a | 12.1878 ± 0.0003 Å |
b | 12.6552 ± 0.0003 Å |
c | 13.4231 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2070.37 ± 0.08 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0407 |
Residual factor for significantly intense reflections | 0.0297 |
Weighted residual factors for significantly intense reflections | 0.0633 |
Weighted residual factors for all reflections included in the refinement | 0.0727 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.157 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4108572.html
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