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Information card for entry 4109019
Preview
| Coordinates | 4109019.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 1002FH ZH-760 C37H67BNO4Sn chiral xx1 |
|---|---|
| Formula | C37 H68 B N O4 Sn |
| Calculated formula | C37 H68 B N O4 Sn |
| SMILES | [Sn]([C@H]1[B]2(OC(N3C(CCCC3(C)C)(C)C)=[O]1)O[C@H](C1CCCCC1)[C@H](O2)C1CCCCC1)(C)(C)[C@H]1[C@@H](CC[C@H](C1)C)C(C)C |
| Title of publication | Preparation of Chiral α-Oxy-[2H1]methyllithiums of 99% ee and Determination of Their Configurational Stability |
| Authors of publication | Dagmar Kapeller; Roland Barth; Kurt Mereiter; Friedrich Hammerschmidt |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 914 - 923 |
| a | 12.6228 ± 0.0005 Å |
| b | 15.3039 ± 0.0006 Å |
| c | 20.0687 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3876.8 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0172 |
| Residual factor for significantly intense reflections | 0.0165 |
| Weighted residual factors for significantly intense reflections | 0.042 |
| Weighted residual factors for all reflections included in the refinement | 0.0424 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4109019.html
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