Information card for entry 4109501

Structure parameters

• Formula: C34 H34 Cl4 Ga P5
• Calculated formula: C34 H34 Cl4 Ga P5
• SMILES: [P+]1(P(P(P(P1c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)(C(C)(C)C)c1ccccc1.[Ga](Cl)([Cl-])(Cl)Cl
• Title of publication: Cyclotetraphosphinophosphonium Ions: Synthesis, Structures, and Pseudorotation
• Authors of publication: C. Adam Dyker; Susanne D. Riegel; Neil Burford; Michael D. Lumsden; Andreas Decken
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2007
• Journal volume: 129
• Pages of publication: 7464 - 7474
• a: 10.2161 ± 0.0012 Å
• b: 11.7132 ± 0.0014 Å
• c: 16.928 ± 0.002 Å
• α: 82.232 ± 0.002°
• β: 80.76 ± 0.002°
• γ: 66.707 ± 0.002°
• Cell volume: 1830.7 ± 0.4 ų
• Cell temperature: 198 ± 1 K
• Ambient diffraction temperature: 198 ± 1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0486
• Residual factor for significantly intense reflections: 0.0329
• Weighted residual factors for significantly intense reflections: 0.0774
• Weighted residual factors for all reflections included in the refinement: 0.0893
• Goodness-of-fit parameter for all reflections included in the refinement: 1.06
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No