Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4109736
Preview
| Coordinates | 4109736.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C89 H156 N12 Si2 Ta4 |
|---|---|
| Calculated formula | C89 H156 N12 Si2 Ta4 |
| Title of publication | Dinitrogen Activation at Ambient Temperatures: New Modes of H2 and PhSiH3 Additions for an "End-On-Bridged" [Ta(IV)]2(μ-η1:η1-N2) Complex and for the Bis(μ-nitrido) [Ta(V)(μ-N)]2 Product Derived from Facile N\τbN Bond Cleavage |
| Authors of publication | Masakazu Hirotsu; Philip P. Fontaine; Albert Epshteyn; Lawrence R. Sita |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 9284 - 9285 |
| a | 10.7416 ± 0.0005 Å |
| b | 12.3472 ± 0.0006 Å |
| c | 19.2441 ± 0.0009 Å |
| α | 81.137 ± 0.001° |
| β | 81.316 ± 0.001° |
| γ | 73.391 ± 0.001° |
| Cell volume | 2401.2 ± 0.2 Å3 |
| Cell temperature | 220 ± 2 K |
| Ambient diffraction temperature | 220 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0394 |
| Residual factor for significantly intense reflections | 0.0278 |
| Weighted residual factors for significantly intense reflections | 0.0577 |
| Weighted residual factors for all reflections included in the refinement | 0.0623 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4109736.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.