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Information card for entry 4109738
Preview
| Coordinates | 4109738.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Ditantalum mu-nitrogen hydrogen complex |
|---|---|
| Formula | C42 H72 N6 Si Ta2 |
| Calculated formula | C42 H72 N6 Si Ta2 |
| Title of publication | Dinitrogen Activation at Ambient Temperatures: New Modes of H2 and PhSiH3 Additions for an "End-On-Bridged" [Ta(IV)]2(μ-η1:η1-N2) Complex and for the Bis(μ-nitrido) [Ta(V)(μ-N)]2 Product Derived from Facile N\τbN Bond Cleavage |
| Authors of publication | Masakazu Hirotsu; Philip P. Fontaine; Albert Epshteyn; Lawrence R. Sita |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 9284 - 9285 |
| a | 10.6823 ± 0.0008 Å |
| b | 10.9599 ± 0.0008 Å |
| c | 20.1009 ± 0.0015 Å |
| α | 97.2 ± 0.001° |
| β | 99.515 ± 0.001° |
| γ | 95.836 ± 0.001° |
| Cell volume | 2284.6 ± 0.3 Å3 |
| Cell temperature | 220 ± 2 K |
| Ambient diffraction temperature | 220 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0458 |
| Residual factor for significantly intense reflections | 0.0264 |
| Weighted residual factors for significantly intense reflections | 0.0546 |
| Weighted residual factors for all reflections included in the refinement | 0.0599 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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