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Information card for entry 4109742
Preview
| Coordinates | 4109742.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H20 Mo Si |
|---|---|
| Calculated formula | C24 H20 Mo Si |
| SMILES | [Mo]123456789%10%11[c]%12([Si]([c]%136[cH]7[cH]8[cH]9[cH]%10[cH]%11%13)(c6ccccc6)c6ccccc6)[cH]1[cH]2[cH]3[cH]4[cH]5%12 |
| Title of publication | [1]Molybdarenophanes: Strained Metallarenophanes with Aluminum, Gallium, and Silicon in Bridging Positions |
| Authors of publication | Clinton L. Lund; Jörg A. Schachner; J. Wilson Quail; Jens Müller |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 9313 - 9320 |
| a | 7.879 ± 0.0005 Å |
| b | 18.5687 ± 0.0013 Å |
| c | 14.5051 ± 0.0009 Å |
| α | 90° |
| β | 120.59 ± 0.004° |
| γ | 90° |
| Cell volume | 1826.8 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1169 |
| Residual factor for significantly intense reflections | 0.0633 |
| Weighted residual factors for significantly intense reflections | 0.1002 |
| Weighted residual factors for all reflections included in the refinement | 0.1167 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4109742.html
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Users of the data should acknowledge the original authors of the
structural data.