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Information card for entry 4109756
Preview
Coordinates | 4109756.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H35 N O2 Si |
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Calculated formula | C30 H35 N O2 Si |
SMILES | C(=O)([C@@H]1[C@@H](/C(=C\CCC)[Si](c2ccccc2)(c2ccccc2)C(C)(C)C)O1)Nc1ccccc1.C(=O)([C@H]1[C@H](/C(=C\CCC)[Si](c2ccccc2)(c2ccccc2)C(C)(C)C)O1)Nc1ccccc1 |
Title of publication | Aluminum-Catalyzed Enantio- and Diastereoselective Carbonyl Addition of Propargylsilanes. A New Approach to Enantioenriched Vinyl Epoxides |
Authors of publication | David A. Evans; Yimon Aye |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2007 |
Journal volume | 129 |
Pages of publication | 9606 - 9607 |
a | 9.5087 ± 0.0017 Å |
b | 21.076 ± 0.004 Å |
c | 26.118 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5234.2 ± 1.7 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.1235 |
Residual factor for significantly intense reflections | 0.0781 |
Weighted residual factors for significantly intense reflections | 0.176 |
Weighted residual factors for all reflections included in the refinement | 0.2004 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4109756.html
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