Information card for entry 4109965

Structure parameters

• Formula: C26 H46 Cl2 N4 Si5
• Calculated formula: C26 H46 Cl2 N4 Si5
• SMILES: C1(c2ccccc2)=[N]([Si]2(N1[Si](C)(C)C)(Cl)(Cl)[N](=C(c1ccccc1)N2[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C
• Title of publication: Synthesis and Structures of Heteroleptic Silylenes
• Authors of publication: Cheuk-Wai So; Herbert W. Roesky; Prabhuodeyara M. Gurubasavaraj; Rainer B. Oswald; Michael T. Gamer; Peter G. Jones; Steffen Blaurock
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2007
• Journal volume: 129
• Pages of publication: 12049 - 12054
• a: 21.2473 ± 0.0015 Å
• b: 8.9149 ± 0.0005 Å
• c: 18.8561 ± 0.0014 Å
• α: 90°
• β: 90.016 ± 0.006°
• γ: 90°
• Cell volume: 3571.7 ± 0.4 ų
• Cell temperature: 200 ± 2 K
• Ambient diffraction temperature: 200 ± 2 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0433
• Residual factor for significantly intense reflections: 0.0321
• Weighted residual factors for significantly intense reflections: 0.0812
• Weighted residual factors for all reflections included in the refinement: 0.0857
• Goodness-of-fit parameter for all reflections included in the refinement: 1.027
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No