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Information card for entry 4109984
Preview
Coordinates | 4109984.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H30 O9 Ru3 Sn3 |
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Calculated formula | C45 H30 O9 Ru3 Sn3 |
SMILES | [Ru]123([Ru]4([Ru]1([Sn]3(c1ccccc1)c1ccccc1)([Sn]4(c1ccccc1)c1ccccc1)(C#[O])(C#[O])C#[O])([Sn]2(c1ccccc1)c1ccccc1)(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | Synthesis, Characterization, and Electronic Structures of a Series of Two-Dimensional Trimetallic Cluster Complexes, Ru3(CO)9(μ-SnPh2)3[Pt(PBut3)]x, x = 0-3 |
Authors of publication | Richard D. Adams; Burjor Captain; Michael B. Hall; Eszter Trufan; Xinzheng Yang |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2007 |
Journal volume | 129 |
Pages of publication | 12328 - 12340 |
a | 24.8837 ± 0.0011 Å |
b | 16.4642 ± 0.0007 Å |
c | 25.8863 ± 0.0011 Å |
α | 90° |
β | 117.634 ± 0.001° |
γ | 90° |
Cell volume | 9395.6 ± 0.7 Å3 |
Cell temperature | 294 ± 2 K |
Ambient diffraction temperature | 294 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1081 |
Residual factor for significantly intense reflections | 0.0485 |
Weighted residual factors for significantly intense reflections | 0.0878 |
Weighted residual factors for all reflections included in the refinement | 0.1124 |
Goodness-of-fit parameter for all reflections included in the refinement | 1 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4109984.html
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