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Information card for entry 4110024
Preview
| Coordinates | 4110024.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H72 N4 Zr |
|---|---|
| Calculated formula | C52 H72 N4 Zr |
| SMILES | [Zr]12(N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)N(C=CN2c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Multi-electron Activation of Dioxygen on Zirconium(IV) to Give an Unprecedented Bisperoxo Complex |
| Authors of publication | Corneliu Stanciu; Mary E. Jones; Phillip E. Fanwick; Mahdi M. Abu-Omar |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2007 |
| Journal volume | 129 |
| Pages of publication | 12400 - 12401 |
| a | 22.6391 ± 0.0005 Å |
| b | 10.4105 ± 0.0005 Å |
| c | 21.8924 ± 0.0008 Å |
| α | 90° |
| β | 112.59 ± 0.0014° |
| γ | 90° |
| Cell volume | 4763.8 ± 0.3 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.082 |
| Residual factor for significantly intense reflections | 0.043 |
| Weighted residual factors for significantly intense reflections | 0.096 |
| Weighted residual factors for all reflections included in the refinement | 0.113 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.94 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MO-Kα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4110024.html
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Users of the data should acknowledge the original authors of the
structural data.