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Information card for entry 4110036
Preview
Coordinates | 4110036.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H42 N2 O5 Si |
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Calculated formula | C25 H42 N2 O5 Si |
SMILES | [Si](O)([C@H]1[C@H]([C@H](OC(=O)Nc2ccc(N(=O)=O)cc2)C[C@H](C1)C(C)C)C)(C(C)(C)C)C(C)(C)C.[Si](O)([C@@H]1[C@@H]([C@@H](OC(=O)Nc2ccc(N(=O)=O)cc2)C[C@@H](C1)C(C)C)C)(C(C)(C)C)C(C)(C)C |
Title of publication | Metal-Catalyzed Silylene Insertions of Allylic Ethers: Stereoselective Formation of Chiral Allylic Silanes |
Authors of publication | Laura E. Bourque; Pamela A. Cleary; K. A. Woerpel |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2007 |
Journal volume | 129 |
Pages of publication | 12602 - 12603 |
a | 10.4889 ± 0.001 Å |
b | 14.5745 ± 0.0013 Å |
c | 17.6357 ± 0.0016 Å |
α | 90° |
β | 90.986 ± 0.002° |
γ | 90° |
Cell volume | 2695.6 ± 0.4 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0527 |
Residual factor for significantly intense reflections | 0.0358 |
Weighted residual factors for significantly intense reflections | 0.0884 |
Weighted residual factors for all reflections included in the refinement | 0.1006 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4110036.html
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Users of the data should acknowledge the original authors of the
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