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Information card for entry 4110844
Preview
| Coordinates | 4110844.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H16 F12 Ni S4 |
|---|---|
| Calculated formula | C22 H16 F12 Ni S4 |
| SMILES | [Ni]123SC(=C([S]1CC[S]2C(=C(S3)C(F)(F)F)C(F)(F)F)C(F)(F)F)C(F)(F)F.c1ccccc1.c1ccccc1 |
| Title of publication | New Insight into Reactions of Ni(S2C2(CF3)2)2 with Simple Alkenes: Alkene Adduct versus Dihydrodithiin Product Selectivity Is Controlled by [Ni(S2C2(CF3)2)2]- Anion |
| Authors of publication | Daniel J. Harrison; Neilson Nguyen; Alan J. Lough; Ulrich Fekl |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2006 |
| Journal volume | 128 |
| Pages of publication | 11026 - 11027 |
| a | 15.4788 ± 0.0007 Å |
| b | 11.214 ± 0.0003 Å |
| c | 16.5552 ± 0.0007 Å |
| α | 90° |
| β | 114.604 ± 0.0015° |
| γ | 90° |
| Cell volume | 2612.73 ± 0.18 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0827 |
| Residual factor for significantly intense reflections | 0.0444 |
| Weighted residual factors for significantly intense reflections | 0.1016 |
| Weighted residual factors for all reflections included in the refinement | 0.1207 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4110844.html
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Users of the data should acknowledge the original authors of the
structural data.