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Information card for entry 4111910
Preview
| Coordinates | 4111910.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [Ni4(bptz)4(CH3CN)8][SbF6]7[I] |
|---|---|
| Formula | C64 H56 F42 I N32 Ni4 Sb7 |
| Calculated formula | C64 H56 F42 I N32 Ni4 Sb7 |
| Title of publication | Anion Template Effect on the Self-Assembly and Interconversion of Metallacyclophanes |
| Authors of publication | Cristian Saul Campos-Fernández; Brandi L. Schottel; Helen T. Chifotides; Jitendra K. Bera; John Bacsa; John M. Koomen; David H. Russell; Kim R. Dunbar |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2005 |
| Journal volume | 127 |
| Pages of publication | 12909 - 12923 |
| a | 18.145 ± 0.004 Å |
| b | 14.925 ± 0.003 Å |
| c | 22.529 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6101 ± 2 Å3 |
| Cell temperature | 110 ± 2 K |
| Ambient diffraction temperature | 110 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 23 |
| Hermann-Mauguin space group symbol | I 2 2 2 |
| Hall space group symbol | I 2 2 |
| Residual factor for all reflections | 0.0764 |
| Residual factor for significantly intense reflections | 0.0655 |
| Weighted residual factors for significantly intense reflections | 0.1625 |
| Weighted residual factors for all reflections included in the refinement | 0.1694 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.909 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4111910.html
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