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Information card for entry 4112004
Preview
Coordinates | 4112004.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H50 B Sc |
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Calculated formula | C44 H50 B Sc |
SMILES | [Sc]12345678([c]9([c]1([c]2([c]3([c]49C)C)C)C)C)[c]1([c]5([c]6([c]7([c]81C)C)C)C)C.c1(ccccc1)[B-](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Naked (C5Me5)2M Cations (M = Sc, Ti, and V) and Their Fluoroarene Complexes |
Authors of publication | Marco W. Bouwkamp; Peter H. M. Budzelaar; Jeroen Gercama; Isabel Del Hierro Morales; Jeanette de Wolf; Auke Meetsma; Sergei I. Troyanov; Jan H. Teuben; Bart Hessen |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2005 |
Journal volume | 127 |
Pages of publication | 14310 - 14319 |
a | 11.8975 ± 0.0008 Å |
b | 12.4108 ± 0.0008 Å |
c | 12.7617 ± 0.0008 Å |
α | 97.33 ± 0.001° |
β | 102.134 ± 0.001° |
γ | 104.13 ± 0.001° |
Cell volume | 1754.4 ± 0.2 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0666 |
Residual factor for significantly intense reflections | 0.0477 |
Weighted residual factors for significantly intense reflections | 0.1108 |
Weighted residual factors for all reflections included in the refinement | 0.1193 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4112004.html
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Users of the data should acknowledge the original authors of the
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