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Information card for entry 4112128
Preview
Coordinates | 4112128.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H88 Lu2 N6 O2 Si8 |
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Calculated formula | C32 H88 Lu2 N6 O2 Si8 |
SMILES | C[Si](C)(C)N([Lu]1(N([Si](C)(C)C)[Si](C)(C)C)([O]2CCCC2)[N]2=[N]1[Lu]2(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[O]1CCCC1)[Si](C)(C)C |
Title of publication | Reduction of Dinitrogen to Planar Bimetallic M2(μ-η2:η2-N2) Complexes of Y, Ho, Tm, and Lu Using the K/Ln[N(SiMe3)2]3 Reduction System |
Authors of publication | William J. Evans; David S. Lee; Joseph W. Ziller |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 454 - 455 |
a | 10.7686 ± 0.0004 Å |
b | 23.4769 ± 0.0009 Å |
c | 11.4898 ± 0.0004 Å |
α | 90° |
β | 112.759 ± 0.001° |
γ | 90° |
Cell volume | 2678.61 ± 0.17 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0235 |
Residual factor for significantly intense reflections | 0.0207 |
Weighted residual factors for significantly intense reflections | 0.0448 |
Weighted residual factors for all reflections included in the refinement | 0.0457 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4112128.html
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