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Information card for entry 4112422
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Coordinates | 4112422.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | pentaerythritol-tetrakis(2,3,5,6-tetrafluoro-4iodophenyl)ether. 1,2-diaminoethane |
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Formula | C33 H24 F16 I4 N4 O4 |
Calculated formula | C33 H16 F16 I4 N4 O4 |
SMILES | C(COc1c(F)c(F)c(I)c(F)c1F)(COc1c(c(c(c(c1F)F)I)F)F)(COc1c(c(c(c(c1F)F)I)F)F)COc1c(F)c(F)c(I)c(F)c1F.NCCN.NCCN |
Title of publication | Halogen Bonding and π...π Stacking Control Reactivity in the Solid State |
Authors of publication | Tullio Caronna; Rosalba Liantonio; Thomas A. Logothetis; Pierangelo Metrangolo; Tullio Pilati; Giuseppe Resnati |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 4500 - 4501 |
a | 22.805 ± 0.005 Å |
b | 15.455 ± 0.003 Å |
c | 15.417 ± 0.003 Å |
α | 90° |
β | 129.68 ± 0.03° |
γ | 90° |
Cell volume | 4182 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0571 |
Residual factor for significantly intense reflections | 0.0423 |
Weighted residual factors for significantly intense reflections | 0.1168 |
Weighted residual factors for all reflections included in the refinement | 0.127 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4112422.html
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