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Information card for entry 4112430
Preview
Coordinates | 4112430.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 2 |
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Formula | C72 H109 Fe2 N6 O2 S |
Calculated formula | C72 H109 Fe2 N6 O2 S |
SMILES | CC1=CC(C)=[N](c2c(cccc2C(C)C)C(C)C)[Fe]2(N(c3ccccc3)[NH2][Fe]3(N(c4c(cccc4C(C)C)C(C)C)C(=CC(C)=[N]3c3c(cccc3C(C)C)C(C)C)C)S2)N1c1c(cccc1C(C)C)C(C)C.CCOCC.CCOCC |
Title of publication | A Sulfido-Bridged Diiron(II) Compound and Its Reactions with Nitrogenase-Relevant Substrates |
Authors of publication | Javier Vela; Sebastian Stoian; Christine J. Flaschenriem; Eckard Münck; Patrick L. Holland |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 4522 - 4523 |
a | 14.4629 ± 0.0014 Å |
b | 36.477 ± 0.004 Å |
c | 14.7829 ± 0.0015 Å |
α | 90° |
β | 112.165 ± 0.002° |
γ | 90° |
Cell volume | 7222.6 ± 1.3 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1679 |
Residual factor for significantly intense reflections | 0.0825 |
Weighted residual factors for significantly intense reflections | 0.1838 |
Weighted residual factors for all reflections included in the refinement | 0.219 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4112430.html
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