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Information card for entry 4112744
Preview
Coordinates | 4112744.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H48 N Ni P3 S3 Se |
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Calculated formula | C60 H48 N Ni P3 S3 Se |
SMILES | [Ni]12(Sc3c([P]2(c2c(S1)cccc2)c1c(S)cccc1)cccc3)[Se]c1ccccc1.P(=N[P+](c1ccccc1)(c1ccccc1)c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Mononuclear Nickel(III) and Nickel(II) Thiolate Complexes with Intramolecular S-H Proton Interacting with Both Sulfur and Nickel: Relevance to the [NiFe]/[NiFeSe] Hydrogenases |
Authors of publication | Chien-Ming Lee; Chien-Hong Chen; Shyue-Chu Ke; Gene-Hsiang Lee; Wen-Feng Liaw |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 8406 - 8412 |
a | 10.6259 ± 0.0001 Å |
b | 15.5533 ± 0.0001 Å |
c | 17.0817 ± 0.0001 Å |
α | 87.7054 ± 0.0003° |
β | 73.0004 ± 0.0003° |
γ | 74.681 ± 0.0003° |
Cell volume | 2601.67 ± 0.03 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0754 |
Residual factor for significantly intense reflections | 0.0459 |
Weighted residual factors for significantly intense reflections | 0.1069 |
Weighted residual factors for all reflections included in the refinement | 0.1375 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.107 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4112744.html
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