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Information card for entry 4112902
Preview
Coordinates | 4112902.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [Na]2[Dipp*Ge(mu-H)]2 |
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Formula | C60 H76 Ge2 Na2 |
Calculated formula | C60 H76 Ge2 Na2 |
SMILES | C(C)(c1c(c2c([Ge]34[H][Ge]4(c4c(cccc4c4c(cccc4C(C)C)C(C)C)c4c(cccc4C(C)C)C(C)C)[H]3)c(ccc2)c2c(C(C)C)cccc2C(C)C)c(ccc1)C(C)C)C.[Na+].[Na+] |
Title of publication | Reduction of Digermenes with Alkali Metals: Salts of Formula M2[{Ge(H)Ar'}2] (M = Li, Na, or K, Ar' = Terphenyl) with Three Different Structures |
Authors of publication | Anne F. Richards; Marcin Brynda; Philip P. Power |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 10530 - 10531 |
a | 11.6034 ± 0.0015 Å |
b | 17.856 ± 0.002 Å |
c | 13.1893 ± 0.0017 Å |
α | 90° |
β | 100.058 ± 0.002° |
γ | 90° |
Cell volume | 2690.7 ± 0.6 Å3 |
Cell temperature | 91 ± 2 K |
Ambient diffraction temperature | 91 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0472 |
Residual factor for significantly intense reflections | 0.0384 |
Weighted residual factors for significantly intense reflections | 0.1042 |
Weighted residual factors for all reflections included in the refinement | 0.1112 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4112902.html
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