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Information card for entry 4113162
Preview
Coordinates | 4113162.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H50 Cl6 Cr2 N2 P4 |
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Calculated formula | C60 H50 Cl6 Cr2 N2 P4 |
SMILES | c1(ccccc1)N1[P](c2ccccc2)(c2ccccc2)[Cr]2([Cl][Cr]3([P](c4ccccc4)(N(c4ccccc4)[P]3(c3ccccc3)c3ccccc3)c3ccccc3)([Cl]2)(Cl)Cl)(Cl)(Cl)[P]1(c1ccccc1)c1ccccc1 |
Title of publication | Ethylene Tetramerization: A New Route to Produce 1-Octene in Exceptionally High Selectivities |
Authors of publication | Annette Bollmann; Kevin Blann; John T. Dixon; Fiona M. Hess; Esna Killian; Hulisani Maumela; David S. McGuinness; David H. Morgan; Arno Neveling; Stefanus Otto; Matthew Overett; Alexandra M. Z. Slawin; Peter Wasserscheid; Sven Kuhlmann |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 14712 - 14713 |
a | 9.1642 ± 0.0018 Å |
b | 15.136 ± 0.003 Å |
c | 20.242 ± 0.004 Å |
α | 90° |
β | 96.767 ± 0.004° |
γ | 90° |
Cell volume | 2788.2 ± 1 Å3 |
Cell temperature | 125 ± 2 K |
Ambient diffraction temperature | 125 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.2176 |
Residual factor for significantly intense reflections | 0.0711 |
Weighted residual factors for significantly intense reflections | 0.1012 |
Weighted residual factors for all reflections included in the refinement | 0.1366 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.867 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113162.html
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Users of the data should acknowledge the original authors of the
structural data.