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Information card for entry 4113184
Preview
Coordinates | 4113184.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C50 H42 Br4 S14 Si4 |
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Calculated formula | C50 H42 Br4 S14 Si4 |
SMILES | s1c(c(Br)c2c3c4c5c6c7c(c(sc7sc6sc5Sc5sc6sc7sc(c(Br)c7c6c5c5c6c7c(Br)c(sc7sc6sc5Sc4sc3sc12)[Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)Br)[Si](C)(C)C.c1ccccc1 |
Title of publication | Helically Annelated and Cross-Conjugated Oligothiophenes: Asymmetric Synthesis, Resolution, and Characterization of a Carbon-Sulfur [7]Helicene |
Authors of publication | Andrzej Rajca; Makoto Miyasaka; Maren Pink; Hua Wang; Suchada Rajca |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2004 |
Journal volume | 126 |
Pages of publication | 15211 - 15222 |
a | 8.1993 ± 0.0003 Å |
b | 10.5684 ± 0.0004 Å |
c | 18.3955 ± 0.0007 Å |
α | 91.34 ± 0.001° |
β | 92.771 ± 0.001° |
γ | 110.617 ± 0.001° |
Cell volume | 1488.81 ± 0.1 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0401 |
Residual factor for significantly intense reflections | 0.0295 |
Weighted residual factors for significantly intense reflections | 0.0698 |
Weighted residual factors for all reflections included in the refinement | 0.0736 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4113184.html
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Users of the data should acknowledge the original authors of the
structural data.