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Information card for entry 4113575
Preview
| Coordinates | 4113575.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C56 H84 N6 P2 Si6 Ta2 |
|---|---|
| Calculated formula | C56 H80 N6 P2 Si6 Ta2 |
| SMILES | c1(ccccc1)N1[Si](C)(C)C[P]2(C[Si](C)(C)N(c3ccccc3)[Ta]3412N([SiH2]CCCC)[Ta]124(N(c4ccccc4)[Si](C[P]2(c2ccccc2)C[Si](C)(C)N1c1ccccc1)(C)C)N3[SiH2]CCCC)c1ccccc1 |
| Title of publication | Hydrosilylation of a Dinuclear Tantalum Dinitrogen Complex: Cleavage of N2 and Functionalization of Both Nitrogen Atoms |
| Authors of publication | Michael D. Fryzuk; Bruce A. MacKay; Brian O. Patrick |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2003 |
| Journal volume | 125 |
| Pages of publication | 3234 - 3235 |
| a | 11.8429 ± 0.0005 Å |
| b | 11.8526 ± 0.0005 Å |
| c | 23.3824 ± 0.0005 Å |
| α | 86.68 ± 0.05° |
| β | 76.24 ± 0.05° |
| γ | 79.36 ± 0.05° |
| Cell volume | 3132.8 ± 0.9 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0981 |
| Residual factor for significantly intense reflections | 0.0748 |
| Weighted residual factors for significantly intense reflections | 0.1992 |
| Weighted residual factors for all reflections included in the refinement | 0.2144 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4113575.html
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