Information card for entry 4114346

Structure parameters

• Formula: C48 H52 Si4
• Calculated formula: C48 H52 Si4
• SMILES: c12ccccc1C1=C(c3c(cc4C5=C(c6c(cccc6)[Si]5(C)C)[Si](c4c3)(C)C)[Si]1(C)C)[Si]2(C)C.c1ccccc1.c1ccccc1.c1ccccc1
• Title of publication: Bis-Silicon-Bridged Stilbene Homologues Synthesized by New Intramolecular Reductive Double Cyclization
• Authors of publication: Shigehiro Yamaguchi; Caihong Xu; Kohei Tamao
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2003
• Journal volume: 125
• Pages of publication: 13662 - 13663
• a: 8.1904 ± 0.0003 Å
• b: 28.139 ± 0.001 Å
• c: 9.196 ± 0.0004 Å
• α: 90°
• β: 92.723 ± 0.003°
• γ: 90°
• Cell volume: 2117.01 ± 0.14 ų
• Cell temperature: 173.2 K
• Ambient diffraction temperature: 173.2 K
• Number of distinct elements: 3
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/a 1
• Hall space group symbol: -P 2yab
• Residual factor for all reflections: 0.0481
• Residual factor for significantly intense reflections: 0.0481
• Weighted residual factors for significantly intense reflections: 0.0701
• Weighted residual factors for all reflections included in the refinement: 0.0701
• Goodness-of-fit parameter for all reflections included in the refinement: 1.223
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No