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Information card for entry 4114565
Preview
| Coordinates | 4114565.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H57.33 K2 O10 Si |
|---|---|
| Calculated formula | C32 H48 K2 O10 Si |
| Title of publication | Structure and Chemistry of 1-Silafluorenyl Dianion, Its Derivatives, and an Organosilicon Diradical Dianion |
| Authors of publication | Yuxia Liu; Thomas C. Stringfellow; David Ballweg; Ilia A. Guzei; Robert West |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2002 |
| Journal volume | 124 |
| Pages of publication | 49 - 57 |
| a | 10.5459 ± 0.0009 Å |
| b | 15.9281 ± 0.0012 Å |
| c | 17.8197 ± 0.0015 Å |
| α | 95.02 ± 0.002° |
| β | 98.726 ± 0.002° |
| γ | 96.053 ± 0.002° |
| Cell volume | 2925.8 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1203 |
| Residual factor for significantly intense reflections | 0.063 |
| Weighted residual factors for significantly intense reflections | 0.169 |
| Weighted residual factors for all reflections included in the refinement | 0.1963 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4114565.html
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structural data.