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Information card for entry 4114782
Preview
Coordinates | 4114782.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H30 Ir2 Mo2 O10 |
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Calculated formula | C30 H30 Ir2 Mo2 O10 |
SMILES | [Ir]1234([Ir]56([Mo]789%101([Mo]1%11%12%1325(C#[O])(C#[O])[c]2([c]1([c]%11([c]%12([c]%132C)C)C)C)C)(C4=O)(C6=O)(C#[O])[c]1([c]7([c]8([c]9([c]%101C)C)C)C)C)(C3=O)(C#[O])C#[O])(C#[O])C#[O] |
Title of publication | Mixed-Metal Cluster Chemistry. 19. Crystallographic, Spectroscopic, Electrochemical, Spectroelectrochemical, and Theoretical Studies of Systematically Varied Tetrahedral Group 6-Iridium Clusters |
Authors of publication | Nigel T. Lucas; Jonathan P. Blitz; Simon Petrie; Robert Stranger; Mark G. Humphrey; Graham A. Heath; Vincent Otieno-Alego |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2002 |
Journal volume | 124 |
Pages of publication | 5139 - 5153 |
a | 16.332 ± 0.002 Å |
b | 16.332 Å |
c | 24.696 ± 0.005 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6587.3 ± 1.6 Å3 |
Cell temperature | 296.2 K |
Ambient diffraction temperature | 296.2 K |
Number of distinct elements | 5 |
Space group number | 92 |
Hermann-Mauguin space group symbol | P 41 21 2 |
Hall space group symbol | P 4abw 2nw |
Residual factor for all reflections | 0.0494 |
Residual factor for significantly intense reflections | 0.0332 |
Weighted residual factors for all reflections | 0.0358 |
Weighted residual factors for all reflections included in the refinement | 0.0341 |
Goodness-of-fit parameter for all reflections | 1.519 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.594 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4114782.html
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Users of the data should acknowledge the original authors of the
structural data.