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Information card for entry 4114877
Preview
| Coordinates | 4114877.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sn4(THME)2[N(Si2)(CH3)6]2 |
|---|---|
| Formula | C22 H54 N2 O6 Si4 Sn4 |
| Calculated formula | C22 H54 N2 O6 Si4 Sn4 |
| SMILES | [Sn]1(N([Si](C)(C)C)[Si](C)(C)C)[O]2[Sn]34[O]1CC1(C[O]4[Sn]45[O]3CC(C2)(C[O]4[Sn](N([Si](C)(C)C)[Si](C)(C)C)[O]5C1)C)C |
| Title of publication | Chemistry of a Novel Family of Tridentate Alkoxy Tin(II) Clusters |
| Authors of publication | Timothy J. Boyle; Judith M. Segall; Todd M. Alam; Mark A. Rodriguez; Jessica M. Santana |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2002 |
| Journal volume | 124 |
| Pages of publication | 6904 - 6913 |
| a | 6.834 ± 0.003 Å |
| b | 17.68 ± 0.007 Å |
| c | 15.981 ± 0.006 Å |
| α | 90° |
| β | 101.05 ± 0.005° |
| γ | 90° |
| Cell volume | 1895.1 ± 1.3 Å3 |
| Cell temperature | 168 ± 2 K |
| Ambient diffraction temperature | 168 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0454 |
| Residual factor for significantly intense reflections | 0.0413 |
| Weighted residual factors for significantly intense reflections | 0.0975 |
| Weighted residual factors for all reflections included in the refinement | 0.1016 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4114877.html
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Users of the data should acknowledge the original authors of the
structural data.