Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4115290
Preview
Coordinates | 4115290.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H16 Br2 F N3 O4 |
---|---|
Calculated formula | C26 H16 Br2 F N3 O4 |
SMILES | BrC1=CC(=O)C2=C(C1=O)C[C@H]1N3N(C(=O)N(C3=O)c3ccccc3)CC=C1[C@@H]2c1cc(Br)c(F)cc1.BrC1=CC(=O)C2=C(C1=O)C[C@@H]1N3N(C(=O)N(C3=O)c3ccccc3)CC=C1[C@H]2c1cc(Br)c(F)cc1 |
Title of publication | Skeletal Diversity via a Branched Pathway: Efficient Synthesis of 29400 Discrete, Polycyclic Compounds and Their Arraying into Stock Solutions |
Authors of publication | Ohyun Kwon; Seung Bum Park; Stuart L. Schreiber |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2002 |
Journal volume | 124 |
Pages of publication | 13402 - 13404 |
a | 10.4042 ± 0.0006 Å |
b | 10.9633 ± 0.0007 Å |
c | 11.9333 ± 0.0007 Å |
α | 87.657 ± 0.001° |
β | 71.839 ± 0.001° |
γ | 69.444 ± 0.001° |
Cell volume | 1207.41 ± 0.13 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0683 |
Residual factor for significantly intense reflections | 0.0466 |
Weighted residual factors for significantly intense reflections | 0.1187 |
Weighted residual factors for all reflections included in the refinement | 0.1303 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115290.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.