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Information card for entry 4115451
Preview
| Coordinates | 4115451.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C300 H304 Cd25 Cl4 O6 P4 Se41 |
|---|---|
| Calculated formula | C276 Cd25 Cl4 O6 P4 Se41 |
| SMILES | O1CCCC1.c1c([Se]2[Cd]3(Cl)[Se](c4ccccc4)[Cd]45[Se]67[Cd]82[Se](c2ccccc2)[Cd](Cl)([Se]4c2ccccc2)[Se]([Cd]27[Se](c4ccccc4)[Cd](Cl)([Se](c4ccccc4)[Cd]6([Se](c4ccccc4)[Cd](Cl)([Se]2c2ccccc2)[Se]8c2ccccc2)[Se]3c2ccccc2)[Se]5c2ccccc2)c2ccccc2)cccc1.[Cd]123[Se]45[Cd]67[Se](c8ccccc8)[Cd]89[Se]%103[Cd]3%11[Se](c%12ccccc%12)[Cd]%124[Se](c4ccccc4)[Cd]4([Se]%131[Cd]1%14[Se](c%15ccccc%15)[Cd]%15([Se]%162[Cd]2([Se](c%17ccccc%17)[Cd]%13([Se](c%13ccccc%13)[Cd]5([Se]2c2ccccc2)[Se](c2ccccc2)[Cd]([P](CCC)(CCC)CCC)([Se]6c2ccccc2)[Se]%12c2ccccc2)[Se](c2ccccc2)[Cd]([P](CCC)(CCC)CCC)([Se]1c1ccccc1)[Se]4c1ccccc1)[Se](c1ccccc1)[Cd]([P](CCC)(CCC)CCC)([Se]%15c1ccccc1)[Se](c1ccccc1)[Cd]%16([Se]8c1ccccc1)[Se]7c1ccccc1)[Se](c1ccccc1)[Cd]%10([Se]%14c1ccccc1)[Se](c1ccccc1)[Cd]([P](CCC)(CCC)CCC)([Se]3c1ccccc1)[Se]9c1ccccc1)[Se]%11c1ccccc1.O1CCCC1.C1COCC1.O1CCCC1.O1CCCC1.O1CCCC1 |
| Title of publication | Size-Dependent Optical Spectroscopy of a Homologous Series of CdSe Cluster Molecules |
| Authors of publication | V. N. Soloviev; A. Eichhöfer; D. Fenske; U. Banin |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2001 |
| Journal volume | 123 |
| Pages of publication | 2354 - 2364 |
| a | 32.664 ± 0.004 Å |
| b | 32.664 ± 0.004 Å |
| c | 32.664 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 34850 ± 7 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 196 |
| Hermann-Mauguin space group symbol | F 2 3 |
| Hall space group symbol | F 2 2 3 |
| Residual factor for all reflections | 0.0645 |
| Residual factor for significantly intense reflections | 0.0476 |
| Weighted residual factors for significantly intense reflections | 0.1311 |
| Weighted residual factors for all reflections included in the refinement | 0.1447 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115451.html
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