Information card for entry 4115498

Structure parameters

• Formula: C32 H30 N2 O4 Pt Se2
• Calculated formula: C32 H30 N2 O4 Pt Se2
• SMILES: [Pt]12([Se]c3ccccc3)([Se]c3ccccc3)([n]3c(ccc4ccc5ccc([n]1c5c34)C)C)[CH](=[CH]2C(=O)OC)C(=O)OC
• Title of publication: Oxidative Additions of E-E Bonds (E = Chalcogen) to Group 10 Metals: "Tunable" Cleavage of Se-Se Bonds by Pt(0) Complexes
• Authors of publication: Vincenzo G. Albano; Magda Monari; Ida Orabona; Achille Panunzi; Francesco Ruffo
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2001
• Journal volume: 123
• Pages of publication: 4352 - 4353
• a: 13.296 ± 0.001 Å
• b: 11.8738 ± 0.0009 Å
• c: 19.282 ± 0.002 Å
• α: 90 ± 0.005°
• β: 100.581 ± 0.002°
• γ: 90 ± 0.005°
• Cell volume: 2992.4 ± 0.4 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0766
• Residual factor for significantly intense reflections: 0.0345
• Weighted residual factors for significantly intense reflections: 0.0616
• Weighted residual factors for all reflections included in the refinement: 0.0688
• Goodness-of-fit parameter for all reflections included in the refinement: 0.783
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No