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Information card for entry 4115533
Preview
Coordinates | 4115533.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H40 N4 O8 |
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Calculated formula | C43 H40 N4 O8 |
SMILES | C(c1ccc(cc1)N(=O)=O)(c1ccc(cc1)N(=O)=O)(c1ccc(cc1)N(=O)=O)c1ccc(cc1)N(=O)=O.c1(cc(cc(c1)C)C)C.c1(cc(cc(c1)C)C)C |
Title of publication | Inclusion Compounds of Tetrakis(4-nitrophenyl)methane: C-H...O Networks, Pseudopolymorphism, and Structural Transformations |
Authors of publication | Ram Thaimattam; Feng Xue; Jagarlapudi A. R. P. Sarma; Thomas C. W. Mak; Gautam R. Desiraju |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2001 |
Journal volume | 123 |
Pages of publication | 4432 - 4445 |
a | 9.968 ± 0.001 Å |
b | 13.147 ± 0.001 Å |
c | 15.747 ± 0.001 Å |
α | 72.4 ± 0.01° |
β | 80.83 ± 0.01° |
γ | 88.49 ± 0.01° |
Cell volume | 1941.4 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.087 |
Residual factor for significantly intense reflections | 0.0711 |
Weighted residual factors for significantly intense reflections | 0.1981 |
Weighted residual factors for all reflections included in the refinement | 0.2139 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.109 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4115533.html
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