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Information card for entry 4115827
Preview
Coordinates | 4115827.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C62 H60 N10 Se10 Te2 Yb4 |
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Calculated formula | C62 H60 N10 Se10 Te2 Yb4 |
SMILES | [Yb]1234([Se]56[Yb]78([Se]1[Se]27)([Se][Yb]15([Se]8[Te]c2ccccc2)([Se]2[Yb]56([Se]12)([Se]3[Se]45)([n]1ccccc1)[n]1ccccc1)([n]1ccccc1)([n]1ccccc1)[n]1ccccc1)([n]1ccccc1)[n]1ccccc1)([Se][Te]c1ccccc1)[n]1ccccc1.n1ccccc1.n1ccccc1 |
Title of publication | Chalcogen-Rich Lanthanide Clusters: Cluster Reactivity and the Influence of Ancillary Ligands on Structure |
Authors of publication | Anna Y. Kornienko; Thomas J. Emge; John G. Brennan |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2001 |
Journal volume | 123 |
Pages of publication | 11933 - 11939 |
a | 12.305 ± 0.006 Å |
b | 31.22 ± 0.019 Å |
c | 19.105 ± 0.009 Å |
α | 90 ± 0.07° |
β | 91.25 ± 0.04° |
γ | 90 ± 0.04° |
Cell volume | 7338 ± 7 Å3 |
Cell temperature | 153 ± 5 K |
Ambient diffraction temperature | 153 ± 5 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.169 |
Residual factor for significantly intense reflections | 0.068 |
Weighted residual factors for significantly intense reflections | 0.1614 |
Weighted residual factors for all reflections included in the refinement | 0.1838 |
Goodness-of-fit parameter for all reflections included in the refinement | 1 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4115827.html
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