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Information card for entry 4116193
Preview
| Coordinates | 4116193.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H31 Cl F6 N4 O2 P2 Ru |
|---|---|
| Calculated formula | C30 H31 Cl F6 N4 O2 P2 Ru |
| SMILES | [Ru]12(Cl)([P](c3ccccc3)(OCC)OCC)([n]3ccccc3c3cccc[n]13)[n]1ccccc1c1cccc[n]21.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Atropisomer and Diastereomer Generation and Control in Ruthenium Bis(bipyridine) Phosphonite Complexes |
| Authors of publication | Dusan Hesek; Guy A. Hembury; Michael G. B. Drew; Seiji Taniguchi; Yoshihisa Inoue |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2000 |
| Journal volume | 122 |
| Pages of publication | 10236 - 10237 |
| a | 12.793 ± 0.002 Å |
| b | 13.881 ± 0.002 Å |
| c | 18.919 ± 0.002 Å |
| α | 90° |
| β | 99.501 ± 0.008° |
| γ | 90° |
| Cell volume | 3313.5 ± 0.8 Å3 |
| Cell temperature | 296.2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0887 |
| Residual factor for significantly intense reflections | 0.0432 |
| Weighted residual factors for significantly intense reflections | 0.1193 |
| Weighted residual factors for all reflections included in the refinement | 0.1402 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116193.html
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