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Information card for entry 4116254
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Coordinates | 4116254.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 99169 |
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Chemical name | A(DIPP)CuSDMP |
Formula | C37 H50 Cu N2 S |
Calculated formula | C37 H50 Cu N2 S |
SMILES | [Cu]1(N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)Sc1c(cccc1C)C |
Title of publication | Spectroscopic and Electronic Structural Studies of Blue Copper Model Complexes. 2. Comparison of Three- and Four-Coordinate Cu(II)-Thiolate Complexes and Fungal Laccase |
Authors of publication | David W. Randall; Serena DeBeer George; Patrick L. Holland; Britt Hedman; Keith O. Hodgson; William B. Tolman; Edward I. Solomon |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2000 |
Journal volume | 122 |
Pages of publication | 11632 - 11648 |
a | 11.3523 ± 0.0002 Å |
b | 17.0133 ± 0.0003 Å |
c | 18.3511 ± 0.0002 Å |
α | 90° |
β | 103.49 ± 0.001° |
γ | 90° |
Cell volume | 3446.55 ± 0.09 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.044 |
Residual factor for significantly intense reflections | 0.0295 |
Weighted residual factors for all reflections | 0.0774 |
Weighted residual factors for significantly intense reflections | 0.0727 |
Goodness-of-fit parameter for all reflections | 1.033 |
Goodness-of-fit parameter for significantly intense reflections | 1.106 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116254.html
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