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Information card for entry 4116404
Preview
Coordinates | 4116404.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C5 H15 F20 N5 P10 Rh2 |
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Calculated formula | C5 H15 F20 N5 P10 Rh2 |
SMILES | [Rh]123([Rh]([P](N([P]1(F)F)C)(F)F)([P](N([P]2(F)F)C)(F)F)([P](N([P]3(F)F)C)(F)F)[P](N([P](F)F)C)(F)F)[P](N([P](F)F)C)(F)F |
Title of publication | Four-Electron Photochemistry of Dirhodium Fluorophosphine Compounds |
Authors of publication | Alan F. Heyduk; Ann M. Macintosh; Daniel G. Nocera |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1999 |
Journal volume | 121 |
Pages of publication | 5023 - 5032 |
a | 28.3689 ± 0.0014 Å |
b | 12.4003 ± 0.0006 Å |
c | 17.3397 ± 0.0009 Å |
α | 90° |
β | 96.306 ± 0.001° |
γ | 90° |
Cell volume | 6062.9 ± 0.5 Å3 |
Cell temperature | 183 ± 2 K |
Ambient diffraction temperature | 183 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0649 |
Residual factor for significantly intense reflections | 0.043 |
Weighted residual factors for all reflections | 0.1011 |
Weighted residual factors for significantly intense reflections | 0.0715 |
Goodness-of-fit parameter for all reflections | 1.124 |
Goodness-of-fit parameter for significantly intense reflections | 1.139 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116404.html
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Users of the data should acknowledge the original authors of the
structural data.