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Information card for entry 4116703
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Coordinates | 4116703.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | BDT |
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Chemical name | α,α'-bis(dithieno[3,2-b:2',3'-d]thiophene |
Formula | C16 H6 S6 |
Calculated formula | C16 H6 S6 |
SMILES | c1cc2c(c3c(cc(s3)c3cc4c(c5c(ccs5)s4)s3)s2)s1 |
Title of publication | A Highly π-Stacked Organic Semiconductor for Thin Film Transistors Based on Fused Thiophenes |
Authors of publication | Xiao-Chang Li; Henning Sirringhaus; Francis Garnier; Andrew B. Holmes; Stephen C. Moratti; Neil Feeder; William Clegg; Simon J. Teat; Richard H. Friend |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1998 |
Journal volume | 120 |
Pages of publication | 2206 - 2207 |
a | 33.689 ± 0.002 Å |
b | 3.8834 ± 0.0002 Å |
c | 11.1055 ± 0.0005 Å |
α | 90° |
β | 101.093 ± 0.002° |
γ | 90° |
Cell volume | 1425.76 ± 0.13 Å3 |
Cell temperature | 160 ± 1 K |
Ambient diffraction temperature | 160 ± 1 K |
Number of distinct elements | 3 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0556 |
Residual factor for significantly intense reflections | 0.0478 |
Weighted residual factors for all reflections | 0.1314 |
Weighted residual factors for significantly intense reflections | 0.1265 |
Goodness-of-fit parameter for all reflections | 1.043 |
Goodness-of-fit parameter for significantly intense reflections | 1.112 |
Diffraction radiation wavelength | 0.6879 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4116703.html
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